Browse Books: Technology & Engineering / Measurement

Introduction to Focused Ion Beam Nanometrology (Iop Concise Physics) By David C. Cox Cover Image

Introduction to Focused Ion Beam Nanometrology (Iop Concise Physics) (Hardcover)
By David C. Cox
$120.00
Usually arrives at our store within 4-7 days

Introduction to Focused Ion Beam Nanometrology (Iop Concise Physics) By David C. Cox Cover Image

Introduction to Focused Ion Beam Nanometrology (Iop Concise Physics) (Paperback)
By David C. Cox
$99.95
Usually arrives at our store within 4-7 days

Engineering Metrology for Pedestrian Falls Prevention and Protection: Theories to Applications for Designing Safer Shoes and Floors By In-Ju Kim Cover Image

Engineering Metrology for Pedestrian Falls Prevention and Protection: Theories to Applications for Designing Safer Shoes and Floors (Paperback)
By In-Ju Kim
$199.99
Usually arrives at our store within 4-7 days

Engineering Metrology for Pedestrian Falls Prevention and Protection: Theories to Applications for Designing Safer Shoes and Floors By In-Ju Kim Cover Image

Engineering Metrology for Pedestrian Falls Prevention and Protection: Theories to Applications for Designing Safer Shoes and Floors (Hardcover)
By In-Ju Kim
$199.99
Usually arrives at our store within 4-7 days

Vacuum Technology: Practice for Scientific Instruments By Nagamitsu Yoshimura Cover Image

Vacuum Technology: Practice for Scientific Instruments (Hardcover)
By Nagamitsu Yoshimura
$219.99
Usually arrives at our store within 4-7 days

Piezoelectric Sensorics: Force Strain Pressure Acceleration and Acoustic Emission Sensors Materials and Amplifiers By Gustav Gautschi Cover Image

Piezoelectric Sensorics: Force Strain Pressure Acceleration and Acoustic Emission Sensors Materials and Amplifiers (Hardcover)
By Gustav Gautschi
$109.99
Usually arrives at our store within 4-7 days

RF and Microwave Measurements: device characterization, signal integrity and spectrum analysis By Andrea Mariscotti Cover Image

RF and Microwave Measurements: device characterization, signal integrity and spectrum analysis (Paperback)
By Andrea Mariscotti
$99.00
Usually arrives at our store within 4-7 days

Optical Measurement of Surface Topography By Richard Leach (Editor) Cover Image

Optical Measurement of Surface Topography (Hardcover)
By Richard Leach (Editor)
$249.99
Usually arrives at our store within 4-7 days

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics) By Sarah Fearn Cover Image

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics) (Hardcover)
By Sarah Fearn
$120.00
Usually arrives at our store within 4-7 days

Physics Experiments with Arduino and Smartphones (Undergraduate Texts in Physics) By Giovanni Organtini Cover Image

Physics Experiments with Arduino and Smartphones (Undergraduate Texts in Physics) (Paperback)
By Giovanni Organtini
$79.99
Usually arrives at our store within 4-7 days

Measurement Uncertainty in Analysis of Plastics: Evaluation by Interlaboratory Test Results By Bruno Wampfler, Samuel Affolter, Axel Ritter Cover Image

Measurement Uncertainty in Analysis of Plastics: Evaluation by Interlaboratory Test Results (Hardcover)
By Bruno Wampfler, Samuel Affolter, Axel Ritter
$129.99
Usually arrives at our store within 4-7 days

Evaluating the Measurement Uncertainty: Fundamentals and Practical Guidance By I. Lira Cover Image

Evaluating the Measurement Uncertainty: Fundamentals and Practical Guidance (Hardcover)
By I. Lira
$250.00
Usually arrives at our store within 4-7 days

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